A Mercury Contact Probe for MOS Measurements on Oxidized Silicon
- 1 February 1970
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 41 (2), 292-293
- https://doi.org/10.1063/1.1684503
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Four Point Mercury Contact Probe for Electrical Resistivity Measurements of Thin FilmsReview of Scientific Instruments, 1968
- Simple Mercury Drop Electrode for MOS MeasurementsReview of Scientific Instruments, 1967