Measurement of the silicon (220) lattice spacing
- 16 May 1994
- journal article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 72 (20), 3133-3136
- https://doi.org/10.1103/physrevlett.72.3133
Abstract
The (220) lattice spacing of a silicon crystal was measured by combined x-ray and optical interferometry to about 3 x 10(-8) relative accuracy. The value obtained is d220 = 192015.551 +/- 0.005 fm. After correcting for the impurity-induced lattice contraction, d220 = 192 015.569 +/- 0.006 fm is obtainedKeywords
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