Saturation of the nonlinear refractive-index change in a semiconductor-doped glass channel waveguide

Abstract
The saturated nonlinear refractive-index change in a CdSxSe1−x semiconductor-doped glass channel waveguide was measured with a picosecond pump-probe Mach–Zehnder interferometer at photon energies below the band gap. The pump-probe configuration permitted the resolution of competing thermal and electronic nonlinearities. The significance of the results for all-optical switching is discussed.