Device Reliability
- 1 January 1977
- book chapter
- Published by Elsevier
Abstract
No abstract availableKeywords
This publication has 34 references indexed in Scilit:
- Degradation sources in GaAs-AlGaAs double-heterostructure lasersIEEE Journal of Quantum Electronics, 1975
- Influence of device fabrication parameters on gradual degradation of (AlGa)As cw laser diodesApplied Physics Letters, 1974
- Observation of Recombination-Enhanced Defect Reactions in SemiconductorsPhysical Review Letters, 1974
- Degradation of AlxGa1−xAs heterojunction electroluminescent devicesApplied Physics Letters, 1974
- Degradation-induced microwave oscillations in double-heterostructure injection lasersApplied Physics Letters, 1974
- SOME ASPECTS OF THE DEGRADATION OF HETEROJUNCTION LASERSSoviet Journal of Quantum Electronics, 1972
- Experimental tests of proposed mechanisms for gradual degradation of GaAs double-heterostructure injection lasersIEEE Journal of Quantum Electronics, 1972
- Catastrophic degradation in GaAs laser diodesSolid-State Electronics, 1970
- Role of optical flux and of current density in gradual degradation of GaAs injection lasersIEEE Journal of Quantum Electronics, 1969
- Permanent degradation of GaAs tunnel diodesSolid-State Electronics, 1964