Depth-selective x-ray standing-wave analysis
- 15 October 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 30 (8), 4881-4884
- https://doi.org/10.1103/physrevb.30.4881
Abstract
Energy-dispersive electron emission yields from silicon crystals were measured while Bragg reflecting 15-keV x rays from the (111) diffraction planes. By combining the characteristics of the excited x-ray standing-wave field with the electron-energy-loss process, it was possible to probe the structure for lattice perfection as a function of depth and to determine an energy-loss-dependent electron escape length.Keywords
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