The relation between Auger signal-to-background ratios and atomic concentration
- 1 August 1985
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 24 (2), 147-156
- https://doi.org/10.1016/0169-4332(85)90220-x
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- A novel SAM technique for the direct measurement of backscattering factors and the elucidation of background shapes in AESSurface Science, 1985
- An important step in quantitative auger analysis: The use of peak to background ratioSurface Science, 1984
- The use of peak to background ratio in quantitative Auger analysisSolid State Communications, 1984
- Techniques for the correction of topographical effects in scanning Auger electron microscopyJournal of Applied Physics, 1983
- Backscattering correction for quantitative Auger analysis: I. Monte Carlo calculations of backscattering factors for standard materialsSurface Science, 1981
- A ratio technique for micro-Auger analysisSurface Science, 1977