Specimen preparation methods for the examination of surfaces and interfaces in the transmission electron microscope
- 1 November 1985
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 140 (2), 195-207
- https://doi.org/10.1111/j.1365-2818.1985.tb02675.x
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- TEM methods for the characterization of fine metal multilayersUltramicroscopy, 1985
- Problem oriented transmission electron microscopyJournal of Microscopy, 1984
- A transmission electron microscopy study of the white-etching layer on a rail headMaterials Science and Engineering, 1984
- The preparation of cross‐section specimens for transmission electron microscopyJournal of Electron Microscopy Technique, 1984
- Direct surface imaging in small metal particlesNature, 1983
- The transmission electron microscopy of oxide scale formation on Fe-Ni-Cr alloysJournal of Microscopy, 1983
- Advances in Transmission Electron Microscope Techniques Applied to Device Failure AnalysisJournal of the Electrochemical Society, 1980
- Method of Preparing TEM Foils from thick Oxides and Metal/Oxide InterfacesBritish Corrosion Journal, 1980
- Deformation behaviour of copper in ultramicrotomyActa Metallurgica, 1976
- Thin foils of non-metals made for electron microscopy by sputter-etchingJournal of Materials Science, 1970