Depth profiling of hydrogen by detection of recoiled protons
- 1 June 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 4 (1), 92-97
- https://doi.org/10.1016/0168-583x(84)90047-8
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Technique for profiling 1H with 2.5-MeV Van de Graaff acceleratorsApplied Physics Letters, 1979
- On the determination of optimum depth-resolution conditions for rutherford backscattering analysisNuclear Instruments and Methods, 1978
- The use of 6Li and 35Cl ion beams in surface analysisNuclear Instruments and Methods, 1978
- Profiling hydrogen in materials using ion beamsNuclear Instruments and Methods, 1978
- Small-angle multiple scattering of ions in the screened Coulomb region: 2. Lateral spreadNuclear Instruments and Methods, 1975
- Use of the nuclear reaction 16O(d,α)14N in the microanalysis of oxide surface layersNuclear Instruments and Methods, 1973