Test of a new Si(111)(2 × 1) surface model by low-energy electron diffraction
- 31 January 1983
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 45 (1), 51-52
- https://doi.org/10.1016/0038-1098(83)90883-9
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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