The Reliability of Memory with Single-Error Correction
- 1 June 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-31 (6), 560-564
- https://doi.org/10.1109/tc.1982.1676042
Abstract
This correspondence contains the derivation of the reliability, as a function of time, of semiconductor memory with single-error correction. The results are applicable to a wide range of memory organizations.Keywords
This publication has 4 references indexed in Scilit:
- Neural networks and conditional association networks. common properties and differencesIEE Proceedings E Computers and Digital Techniques, 1989
- Reliability and Performance of Error-Correcting Memory and Register ArraysIEEE Transactions on Computers, 1980
- Reliability Modeling and Analysis of Fault-Tolerant MemoriesIEEE Transactions on Reliability, 1978
- Special Feature: Semiconductor Memory Reliability with Error Detecting and Correcting CodesComputer, 1976