Thickness Determination of LB Films by X-Ray Diffraction
- 1 October 1989
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 28 (10R)
- https://doi.org/10.1143/jjap.28.1926
Abstract
X-ray diffraction patterns of amorphous-polymer LB films were investigated in detail, and weak peaks at low 2θ angles were found to correspond to the film thickness. The diffractions are considered to be the results of Fourier transformation of two component systems: one at the interface of air and amorphous film, and the other at that of the film and substrate.Keywords
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