Optical properties of WSi2 and MoSi2 single crystals as measured by spectroscopic ellipsometry and reflectometry
- 31 May 1987
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 62 (7), 455-459
- https://doi.org/10.1016/0038-1098(87)91097-0
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Comparison of fully relativistic energy bands and cohesive energies ofandPhysical Review B, 1985
- Optical Characterization of Amorphous and Crystalline Molybdenum Silicide FilmsPhysica Status Solidi (b), 1985
- Molybdenum disilicide: Crystal growth, thermal expansion and resistivitySolid State Communications, 1985
- Effect of heavy doping on the optical properties and the band structure of siliconPhysical Review B, 1984
- Dielectric function of monocrystalline Moby spectroscopic ellipsometryPhysical Review B, 1984
- Refractory silicides for integrated circuitsJournal of Vacuum Science and Technology, 1980
- Refinement of the crystal structure of TiSi2 and some comments on bonding in TiSi2 and related compoundsActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1977
- Über die Kristallstruktur von MoSi2 und WSi2Zeitschrift für Physikalische Chemie, 1927