Ca/Si(111): Thin-film characterization by high-resolution electron-energy-loss spectroscopy
- 15 November 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 34 (10), 7471-7474
- https://doi.org/10.1103/physrevb.34.7471
Abstract
High-resolution electron-energy-loss spectroscopy is used to investigate surface and interface phonons for thin epitaxial Ca layers on Si(111). The dielectric approach used to describe the spectra is found to fail for ultrathin films. The spectra seem to show influences of strain in the film and of the crystalline quality at the interface.
Keywords
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