Interface trap formation via the two-stage H/sup +/ process
- 1 December 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (6), 1848-1857
- https://doi.org/10.1109/23.45378
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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