Design for Autonomous Test
- 1 November 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-30 (11), 866-875
- https://doi.org/10.1109/tc.1981.1675717
Abstract
A technique for modifying networks so that they are capable of self test is presented. The major innovation is partitioning the network into subnetworks with sufficiently few inputs that exhaustive testing of the subnetworks is possible.Keywords
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