Oxygen-Related Defects in Irradiated Germanium

Abstract
Oxygen-related defects produced in oxygen-doped germanium by 1.5 MeV electron irradiation were studied by DLTS technique. Three electron trapping levels attributable to this type of defect were found. The E c-0.25 eV level is deduced to be introduced by two kinds of defects, namely, the germanium A-center (oxygen-vacancy complex) and the defect associated with the 715 cm-1 infrared absorption band reported by Whan. The E c-0.29 eV level and the E c- 0.13 eV level are attributable to the defects associated with the 819 cm-1 and the 731 cm-1 infrared absorption bands in her paper.