Electron spectroscopic imaging: Parallel energy filtering and microanalysis in the fixed-beam electron microscope
- 31 August 1984
- journal article
- Published by Elsevier in Journal of Ultrastructure Research
- Vol. 88 (2), 121-134
- https://doi.org/10.1016/s0022-5320(84)80004-0
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- A revised expression for signal/noise ratio in EELSUltramicroscopy, 1982
- DNA organization in nucleosomesCanadian Journal of Biochemistry, 1982
- The range of validity of EELS microanalysis formulaeUltramicroscopy, 1981
- Spatial resolution and detection sensitivity in microanalysis by electron energy loss selected imagingJournal of Microscopy, 1981
- Phosphorus Distribution in the NucleosomeScience, 1981
- K-shell ionization cross-sections for use in microanalysisUltramicroscopy, 1979
- A simple electron spectrometer for energy analysis in the transmission microscopeUltramicroscopy, 1978
- A Wien Filter for Use as an Energy Analyzer with an Electron MicroscopeReview of Scientific Instruments, 1971
- A High Resolution Electron Spectrometer for Use in Transmission Scanning Electron MicroscopyReview of Scientific Instruments, 1971
- Visibility of Single AtomsScience, 1970