Reflexion electron microscopy using diffracted electrons
- 1 April 1960
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 11 (4), 158-162
- https://doi.org/10.1088/0508-3443/11/4/304
Abstract
Crystalline surfaces have been examined in the reflexion electron microscope with the angles of illumination and viewing adjusted so that diffracted electrons contributed to the images. In this way, the size and distribution of the diffracting regions have been determined. A resolution of 80 Å has been obtained, which is at least four times better than that obtained in normal reflexion micrographs.Keywords
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