A new Methodology for Short Circuit Localization on Integrated Circuits using Magnetic Microscopy Technique Coupled with Simulations
- 1 July 2009
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 19461542,p. 208-212
- https://doi.org/10.1109/ipfa.2009.5232668
Abstract
This article shows how the magnetic technique can be improved to obtain more precise information about fault localization, particularly when other techniques cannot be used. We propose a new methodology based on the coupling of magnetic measurements with magnetic simulations, which we validate on a real case device.Keywords
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