Surface valence band and plasmon features on clean cleaved silicon
- 30 September 1974
- journal article
- Published by Elsevier in Surface Science
- Vol. 45 (1), 128-140
- https://doi.org/10.1016/0039-6028(74)90159-9
Abstract
No abstract availableKeywords
This publication has 26 references indexed in Scilit:
- X-Ray Photoemission Spectra of Crystalline and Amorphous Si and Ge Valence BandsPhysical Review Letters, 1972
- Auger spectra and LEED patterns from nickel deposits on cleaved siliconSurface Science, 1971
- Characteristic energies in secondary electron spectra from Si(111) surfacesSurface Science, 1971
- Auger spectra and LEED patterns from vacuum cleaved silicon crystals with calibrated deposits of ironSurface Science, 1971
- Auger electron spectroscopy of SiSurface Science, 1970
- Theory for the Energy Distribution of Secondary ElectronsJournal of Vacuum Science and Technology, 1970
- Band structure of silicon by characteristic auger electron spectrum analysisSurface Science, 1970
- Inelastic effects in Auger electron spectroscopySurface Science, 1970
- Auger spectroscopy of siliconSurface Science, 1969
- Thin reaction layers and the surface structure of silicon (111)Surface Science, 1969