Comment on ``Appearance potential spectroscopy''
- 1 August 1973
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 44 (8), 3810-3811
- https://doi.org/10.1063/1.1662854
Abstract
Contrary to assertions by Tracy that soft x‐ray appearance potential spectroscopy cannot be applied to semiconductors and insulators, we have encountered no obstacles in obtaining good spectra from both classes of materials. In addition to previously published spectra of boron and transition‐metal oxides, we present 1s and 2p spectra of clean silicon.Keywords
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- Appearance potential spectroscopyJournal of Applied Physics, 1972
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