Morphology of porous silicon studied by STM/SEM
- 1 May 1990
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 44 (3), 185-192
- https://doi.org/10.1016/0169-4332(90)90049-6
Abstract
No abstract availableFunding Information
- Comisión Interministerial de Ciencia y Tecnología (PB86-0606)
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