Fault Diagnosis in Synchronous Sequential Circuits Based on an Effect–Cause Analysis
- 1 December 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-31 (12), 1165-1172
- https://doi.org/10.1109/tc.1982.1675940
Abstract
In this paper we present a new approach to fault diagnosis in sequential circuits based on an effect–cause analysis. This represents an extension of our previous work dealing with combinational circuits [1]. The main tool of our approach is the Deduction Algorithm, which deduces internal values in the circuit under test based upon the test results. The deduced values are used for fault diagnosis, which encompasses both fault detection and location.Keywords
This publication has 6 references indexed in Scilit:
- A Maximal Resolution Guided-Probe Testing AlgorithmPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1981
- Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause AnalysisIEEE Transactions on Computers, 1980
- On Redundancy and Fault Detection in Sequential CircuitsIEEE Transactions on Computers, 1979
- An Abstract Model for Digital System Fault DiagnosisIEEE Transactions on Computers, 1979
- A Nand Model ror Fault Diagnosis in Combinational Logic NetworksIEEE Transactions on Computers, 1971
- Fault Equivalence in Combinational Logic NetworksIEEE Transactions on Computers, 1971