Analysis of capacitance and transconductance frequency dispersions in MESFETs for surface characterization
- 31 October 1986
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 29 (10), 1087-1097
- https://doi.org/10.1016/0038-1101(86)90110-3
Abstract
No abstract availableKeywords
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