Writing electronic nanometer structures into porous Si films by scanning tunneling microscopy
- 25 April 1994
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 64 (17), 2253-2255
- https://doi.org/10.1063/1.111635
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Surface structure imaging, electronically induced modifications and electroluminescence of porous silicon by scanning tunneling microscopyJournal of Luminescence, 1993
- Models and Mechanisms for the Luminescence of Porous SiMRS Proceedings, 1993
- Role of Hydrogenated Surface in the Photoluminescence of Porous SiliconMRS Proceedings, 1992
- Electronically induced modifications of a-Si:H(P) films by scanning tunneling microscopyJournal of Non-Crystalline Solids, 1991
- Nuclear-magnetic-double-resonance investigation of the dopant microstructure in hydrogenated amorphous siliconPhysical Review B, 1988
- High Resolution Deposition of Silver in Nafion Films with the Scanning Tunneling MicroscopeJournal of the Electrochemical Society, 1988
- Lift-off metallization using poly(methyl methacrylate) exposed with a scanning tunneling microscopeJournal of Vacuum Science & Technology B, 1988
- Molecular manipulation using a tunnelling microscopeNature, 1988
- Transition from the tunneling regime to point contact studied using scanning tunneling microscopyPhysical Review B, 1987
- Scanning tunneling microscopySurface Science, 1983