On-state breakdown in power HEMTs: measurements and modeling
- 1 June 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 46 (6), 1087-1093
- https://doi.org/10.1109/16.766868
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
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