Temperature dependence of the electron intersubband resonance on (100) Si surfaces
- 15 August 1977
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 16 (4), 1590-1596
- https://doi.org/10.1103/physrevb.16.1590
Abstract
The dependence of the electron intersubband resonance on temperature has been studied between 4.2 and 130 K for photon energies 10.45, 15.81, and 44.32 meV. At the highest energy, distinct transitions from the ground state to each of the next three higher-lying levels (i.e., the 0→1, 0→2, 0→3 resonances) are observed. With rising temperature, the lines originating from the 0 ground-state subband shift and diminish in amplitude. The effect is attributed to thermal population of the higher-lying levels, in particular the 0′ subband of the fourfold degenerate valleys in the Si (100) surface. Firsthand evidence for the population of this level, and the existence of two distinct types of electrons at finite temperature, comes from the identification of a new resonance (i.e., the 0′→1′ transition) which grows with increasing temperature.Keywords
This publication has 16 references indexed in Scilit:
- Many-body effects in-type Si inversion layers. II. Excitations to higher subbandsPhysical Review B, 1977
- Effect of a thin transition layer at a Si-SiO2 interface on electron mobility and energy levelsSolid State Communications, 1977
- Voltage-Tunable Far-Infrared Emission from Si Inversion LayersPhysical Review Letters, 1976
- Electronic Structure of Inversion Layers in Many-Valley SemiconductorsPhysical Review Letters, 1976
- Cyclotron resonance of electrons in surface space-charge layers on siliconPhysical Review B, 1976
- Electronic levels in surface space charge layers on Si(100)Physical Review B, 1976
- Temperature-Dependent Cyclotron Mass of Inversion-Layer Electrons in SiPhysical Review Letters, 1975
- Effect of the Electron-Electron Interaction on the Excitation Energies of an-Inversion Layer on SiPhysical Review Letters, 1975
- Resonance Spectroscopy of Electronic Levels in a Surface Accumulation LayerPhysical Review Letters, 1974
- Self-Consistent Results for-Type Si Inversion LayersPhysical Review B, 1972