Transconductance degradation in VVMOS power transistors due to thermal and field effects
- 31 December 1982
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 25 (12), 1165-1170
- https://doi.org/10.1016/0038-1101(82)90075-2
Abstract
No abstract availableKeywords
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