Real-time monitoring of phase transitions of vacuum deposited organic films by molecular beam deposition LEED
- 15 June 1998
- journal article
- Published by Elsevier in Surface Science
- Vol. 408 (1-3), 223-231
- https://doi.org/10.1016/s0039-6028(98)00231-3
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
- Diffraction spot profile analysis for heteroepitaxial surfaces applied to the initial growth stages of CaF2 adlayers on Si(111)Applied Surface Science, 1996
- LEED and DLEED as modern tools for quantitative surface structure determinationReports on Progress in Physics, 1995
- Formation of interfacial dislocation network in surfactant mediated growth of Ge on Si(111) investigated by Spa-Leed: Part ISurface Science, 1993
- A new LEED instrument for quantitative spot profile analysisSurface Science, 1986
- Low-Energy Electron DiffractionSpringer Series in Surface Sciences, 1986
- Epitaxy of Si(111) as studied with a new high resolving LEED systemSurface Science, 1982
- Fast LEED-intensity measurements with a computer controlled television systemApplied Physics A, 1976
- Improved Design and Method of Operation of Low Energy Electron Diffraction EquipmentReview of Scientific Instruments, 1962
- Apparatus for Direct Observation of Low-Energy Electron Diffraction PatternsReview of Scientific Instruments, 1960
- The Scattering of Electrons by NickelScience, 1921