Nonequilibrium electron transport in bipolar devices

Abstract
The dynamics of nonequilibrium electron transport in bipolar devices have been investigated by calculating minority‐carrier elastic and inelastic scattering rates as a function of energy for different majority‐carrier concentrations in typical p‐type III‐V semiconductors. Scattering rates depend on the majority‐carrier concentration and a constraint involving the ratio of electron and heavy‐hole effective mass.