X-ray photoelectron angular distributions with dispersion-compensating x-ray and electron optics
- 1 January 1977
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 11 (1), 39-65
- https://doi.org/10.1016/0368-2048(77)85047-0
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
- Concentration profiles for irregular surfaces from x-ray photoelectron angular distributionsAnalytical Chemistry, 1976
- Enhancement of surface-atom intensities in X-ray photoelectron spectra at low X-ray incidence anglesPhysics Letters A, 1975
- Direct observation of surface-profile effects on X-ray-photoelectron angular distributionsChemical Physics Letters, 1975
- Angular dependence of X-ray photoelectronsJournal of Electron Spectroscopy and Related Phenomena, 1974
- Instrumentation for surface studies: XPS angular distributionsJournal of Electron Spectroscopy and Related Phenomena, 1974
- Surface analysis and angular distributions in x-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1974
- Surface sensitivity and angular dependence of X-ray photoelectron spectraSurface Science, 1973
- Ultrasoft-X-Ray Reflection, Refraction, and Production of Photoelectrons (100-1000-eV Region)Physical Review A, 1972
- Angular distribution of photoelectrons from a metal single crystalPhysics Letters A, 1971
- Angular distribution of electrons in ESCA spectra from a single crystalPhysics Letters A, 1970