Total-dose radiation-induced degradation of thin film ferroelectric capacitors
- 1 December 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 37 (6), 1703-1712
- https://doi.org/10.1109/23.101180
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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