Observations of roughening on In0.1Ga0.9As/GaAs surfaces at atomic force microscopy
- 1 April 1993
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 8 (4), 509-512
- https://doi.org/10.1088/0268-1242/8/4/005
Abstract
No abstract availableKeywords
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