The Dependence of Single Event Upset on Proton Energy (15-590 MeV)
- 1 January 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 29 (6), 2081-2084
- https://doi.org/10.1109/tns.1982.4336500
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Proton-Induced Nuclear Reactions in SiliconIEEE Transactions on Nuclear Science, 1981
- Soft Errors Due to Protons in the Radiation BeltIEEE Transactions on Nuclear Science, 1981
- Energy Spectra of Heavy Fragments from the Interaction of Protons with Communications MaterialsIEEE Transactions on Nuclear Science, 1981
- Upset Phenomena Induced by Energetic Protons and ElectronsIEEE Transactions on Nuclear Science, 1980
- Nuclear Reactions in SemiconductorsIEEE Transactions on Nuclear Science, 1980
- Soft Errors Induced by Energetic ProtonsIEEE Transactions on Nuclear Science, 1979