Principle in Imaging Contrast in Scanning Electron Microscopy for Binary Microstructures Composed of Organosilane Self-Assembled Monolayers
- 28 December 2002
- journal article
- letter
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 107 (3), 664-667
- https://doi.org/10.1021/jp021362r
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Organosilane self‐assembled monolayers formed at the vapour/solid interfaceSurface and Interface Analysis, 2002
- Surface potential images of self‐assembled monolayers patterned by organosilanes: ab initio molecular orbital calculationsSurface and Interface Analysis, 2002
- Surface potentials of patterned organosilane self-assembled monolayers acquired by Kelvin probe force microscopy and ab initio molecular calculationChemical Physics Letters, 2001
- Contrast Studies on Organic Monolayers of Different Molecular Packing in FESEM and Their Correlation with SFM DataLangmuir, 2001
- Fluoroalkylsilane Monolayers Formed by Chemical Vapor Surface Modification on Hydroxylated Oxide SurfacesLangmuir, 1999
- KELVIN PROBE FORCE MICROSCOPY OF MOLECULAR SURFACESAnnual Review of Materials Science, 1999
- Self-assembled monolayers: Recent developments and applicationsCurrent Opinion in Colloid & Interface Science, 1996
- Formation and Structure of Self-Assembled MonolayersChemical Reviews, 1996
- Patterned Self-Assembled Monolayers and Meso-Scale PhenomenaAccounts of Chemical Research, 1995
- Gaussian Basis Sets for Molecular CalculationsPublished by Springer Nature ,1977