Cross−sectional structure of Bi films and its phenomenological analysis
- 1 March 1975
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 46 (3), 1159-1164
- https://doi.org/10.1063/1.322217
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Influence of Residual Gas on the Process of Film GrowthSHINKU, 1973
- Recent advances in epitaxyThin Solid Films, 1972
- Effect of vapour incidence angles on profile and properties of condensed filmsThin Solid Films, 1972
- Calculation of the Polarizabilities of Alkali AtomsJournal of the Physics Society Japan, 1966
- Versuch einer quantitativen Erfassung der Textur von Gold-AufdampfschichtenThe European Physical Journal A, 1965
- Influence of Oxygen on the Surface Mobility of Tin Atoms in Thin FilmsJournal of Applied Physics, 1964
- Nucleation of Vapor DepositsThe Journal of Chemical Physics, 1962
- Theory of Thermal GroovingJournal of Applied Physics, 1957