Characterization of CF4 Plasma-Treated Indium–Tin-Oxide Surfaces Used in Organic Light-Emitting Diodes by X-ray Photoemission Spectroscopy
- 1 October 2007
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 46 (10R)
- https://doi.org/10.1143/jjap.46.6814
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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