Observation of surface treatments on single crystals by reflection electron microscopy
- 1 January 1984
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 15 (1-2), 119-129
- https://doi.org/10.1016/0304-3991(84)90080-9
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Direct imaging of atomic steps in reflection electron microscopyUltramicroscopy, 1984
- Imaging of atomic steps on ultrathin Au films by TEMUltramicroscopy, 1983
- Reflection electron microscopy (REM) of fcc metalsUltramicroscopy, 1983
- Direct surface imaging in small metal particlesNature, 1983
- Principles of a TEM specimen device to meet highest requirements: Specimen temperature 5–300 K, cryo transfer, condensation protection, specimen tilt, stage stability for highest resolutionUltramicroscopy, 1981
- Observation of atomic steps of (111) surface of a silicon crystal using bright field electron microscopyUltramicroscopy, 1981
- Reflection electron microscopy of clean and gold deposited (111) silicon surfacesSurface Science, 1980
- Darkfield and brightfield techniques for electron microscopic observation of atomic steps on MgO single-crystal surfacesUltramicroscopy, 1979
- Superstructures on Spherical Gold CrystalsZeitschrift für Naturforschung A, 1978
- Direct resolution of surface atomic steps by transmission electron microscopyPhilosophical Magazine, 1974