Quantitative Auger analysis using integration techniques
- 8 October 1973
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 45 (4), 309-310
- https://doi.org/10.1016/0375-9601(73)90092-3
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Fine structures and energy distribution of secondary electron emission from Si(111)Journal of Applied Physics, 1973
- Instrument Response Functions for Potential Modulation DifferentiationReview of Scientific Instruments, 1972
- CHEMICAL EFFECTS ON THE KLL AUGER ELECTRON SPECTRUM FROM SURFACE CARBONApplied Physics Letters, 1970
- Resolution and Sensitivity Considerations of an Auger Electron Spectrometer Based on Display LEED OpticsReview of Scientific Instruments, 1969
- Determination of Surface Structures using LEED and Energy Analysis of Scattered ElectronsJournal of Applied Physics, 1969
- Analysis of Materials by Electron-Excited Auger ElectronsJournal of Applied Physics, 1968