Effect of a Thin Surface Film on the Ellipsometric Determination of Optical Constants*
- 1 December 1964
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 54 (12), 1428-1433
- https://doi.org/10.1364/josa.54.001428
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 11 references indexed in Scilit:
- Computer Program Available for Thin Film Studies Using Elliptically Polarized Light*Journal of the Optical Society of America, 1963
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962
- Thin Films Calculations Using the IBM 650 Electronic CalculatorJournal of the Optical Society of America, 1960
- Reflectance-Increasing Coatings for the Vacuum Ultraviolet and Their Applications*Journal of the Optical Society of America, 1960
- Optical Measurement of Film Growth on Silicon and Germanium Surfaces in Room AirJournal of the Electrochemical Society, 1957
- Optical Constants of Silver, Gold, Copper, and Aluminum II The Index of Refraction nJournal of the Optical Society of America, 1954
- Optical Properties of Surface Films. IIReview of Scientific Instruments, 1949
- The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface FilmsReview of Scientific Instruments, 1945
- The validity of Drude's optical method of investigating transparent films on metalsTransactions of the Faraday Society, 1935