Characterization of ultrathin nickel layers on Si(111) using RHEED and RBS
- 1 November 1986
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 27 (2), 143-150
- https://doi.org/10.1016/0169-4332(86)90103-0
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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