Automatic Unit for Thinning Transmission Electron Microscopy Specimens of Metals
- 1 October 1966
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 37 (10), 1351-1353
- https://doi.org/10.1063/1.1719978
Abstract
A specimen holder and a polishing unit with an automatic shutoff were designed for thinning disks taken from preselected areas of large metallic specimens or from specimens with small cross sectional areas. Since the disk precisely fits the specimen holder of the microscope, a supporting grid is unnecessary and deformation from cutting and handling after thinning is eliminated. The automatic shutoff device greatly improves conditions for transmission by stopping the polishing current at the optimum time.Keywords
This publication has 6 references indexed in Scilit:
- Micro-Electropolishing Transmission Electron Microscopy SpecimensReview of Scientific Instruments, 1965
- Electropolishing Unit for Rapid Thinning of Metallic Specimens for Transmission Electron MicroscopyReview of Scientific Instruments, 1964
- Microjet method for preparation of wire samples for transmission electron microscopyJournal of Scientific Instruments, 1963
- Method of preparing Si and Ge specimens for examination by transmission electron microscopyBritish Journal of Applied Physics, 1962
- Sample Preparation for Transmission Electron Microscopy of GermaniumReview of Scientific Instruments, 1961
- Electron Microscope and Diffraction Study of Metal Crystal Textures by Means of Thin SectionsJournal of Applied Physics, 1949