EXAFS in photoelectron yield spectra at K edges of Cu, Ni, and Ge
- 16 September 1979
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 55 (1), 105-108
- https://doi.org/10.1002/pssa.2210550110
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Determination of Bond Lengths from EXAFS with High ResolutionJapanese Journal of Applied Physics, 1978
- Possibility of adsorbate position determination using final-state interference effectsPhysical Review B, 1976
- Theory of the extended x-ray absorption fine structurePhysical Review B, 1975
- The probing depth in photoemission and auger-electron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1974
- Attenuation lengths of low-energy electrons in solidsSurface Science, 1974