Bulk carrier lifetime measurement from transient diffusion photocurrent in semiconductor diodes
- 31 October 1978
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 21 (10), 1219-1226
- https://doi.org/10.1016/0038-1101(78)90369-6
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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