Characterization of stacking faults with the field-ion microscope
- 1 August 1970
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 22 (176), 317-327
- https://doi.org/10.1080/14786437008228227
Abstract
A new sign convention for fault vectors and Burgers vectors of partial dislocations is introduced. Using this convention, methods for distinguishing between intrinsic and extrinsic faults in field-ion micrographs arc developed. In general the type of the fault is deduced from the relative displacements of the atoms in the two sides of the plane of the fault; this information can be obtained from the micrographs. Different methods are used, depending on whether or not the fault ends in an imaged pole. The characterization of {111} faults in f.c.c. metals is considered in detail.Keywords
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