Co2Si, CrSi2, ZrSi2 and TiSi2 formation studied by a radioactive 31Si marker technique
- 1 July 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 93 (1-2), 127-133
- https://doi.org/10.1016/0040-6090(82)90097-9
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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