Study of K emission spectra of SiO by electromicroprobe
- 28 April 1976
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 9 (8), 1535-1537
- https://doi.org/10.1088/0022-3719/9/8/024
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- THIN FILM CHARACTERIZATION BY ELECTRON MICROPROBE AND ELLIPSOMETRY: SiO2 FILMS ON SILICONApplied Physics Letters, 1969
- Chemical Bonding Studies of Silicates and Oxides by X-Ray K-Emission SpectroscopyJournal of Applied Physics, 1968
- The evaluation of thin film insulatorsThin Solid Films, 1968
- Silicon valence in SiO films studied by X-ray emissionSolid State Communications, 1964