An external beam technique for proton-induced X-ray emission analysis
- 15 August 1976
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 137 (1), 119-124
- https://doi.org/10.1016/0029-554x(76)90256-1
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Analyse sous helium par la technique de fluorescence X induite par protonsNuclear Instruments and Methods, 1975
- Elimination of charging in the proton-induced x-ray emission analysis of insulating samplesNuclear Instruments and Methods, 1975
- Trace-element analysis by X-ray fluorescence with an external proton beamNuclear Instruments and Methods, 1975
- Isotope excited x-ray fluorescenceAnalytical Chemistry, 1972