A Josephson sampler with 2.1 ps resolution
- 1 March 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 21 (2), 226-229
- https://doi.org/10.1109/tmag.1985.1063713
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Fluxon Observation Using a Josephson SamplerJapanese Journal of Applied Physics, 1983
- A Direct Coupled Josephson SamplerJapanese Journal of Applied Physics, 1983
- Picosecond and subpicosecond optoelectronics for measurements of future high speed electronic devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983
- Electronically adjustable delay for Josephson technologyIEEE Electron Device Letters, 1982
- High current-density Josephson edge-junction capacitancePhysica B+C, 1981
- Josephson junctions of small area formed on the edges of niobium filmsApplied Physics Letters, 1980
- A Josephson ultrahigh-resolution sampling systemApplied Physics Letters, 1980
- Generation and measurement of ultrashort current pulses with Josephson devicesApplied Physics Letters, 1980
- Turn-on delay of Josephson interferometer logic devicesIEEE Transactions on Magnetics, 1979