Dielectric Properties of SrTiO3 Epitaxial Film and Their Application to Measurement of Work Function of YBa2Cu3Oy Epitaxial Film
- 1 September 1992
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 31 (9B), L1345-1347
- https://doi.org/10.1143/jjap.31.l1345
Abstract
The dielectric properties of SrTiO3 epitaxial film were studied using film grown on oxide superconductor YBa2Cu3O y . They were, to a certain extent, similar to those of the single-crystal bulk in terms of both temperature and electric field dependence, though the value of the dielectric constant was low, particularly at cryogenic temperatures. The observed dielectric properties were analytically expressed. Using the dramatic field dependence of the dielectric constant of the SrTiO3 film in the Au-SrTiO3-YBa2Cu3O y metal-insulator-superconductor (MIS) structure, we determined the work function of (001)YBa2Cu3O y epitaxial film to be ∼6.1 eV.Keywords
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